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Magazine Name : Ieee Transactions On Computers
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Year : 1982 Volume number : 31 Issue: 12 |
Parallel Testing For Pattern-Sensitive Faults In Semiconductor Random-Access Memories
(Article)
Subject:
Memory Testing
,
Dynamic Pattern-Sensitive Fault
,
Ram
,
Static Pattern-Sensitive Fault
Author:
P.
Mazumder
Janak K.
Patel
page:
394
-
407
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